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Job Description:
Develop wafer level cost effective test solution for BST ASIC mass production, including test program and test hardware.
Support test plan definition for IC production and characterization test and discuss with designer about test feasibility.
Define the tester configuration on the target ATE platform based the test requirement.
Enable the final mass production environment at OSAT.
Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis